Atomic force microscopy
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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s at IBM Research - Zurich, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first atomic force microscope (also abbreviated as AFM) in 1986. The first commercially available atomic force microscope was introduced in 1989. The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the nanoscale.
- Related: Scanning tunneling microscope, Scanning probe microscopy, Scanning voltage microscopy, Surface force apparatus
| ME 597/PHYS 570: Fundamentals of Atomic Force Micr... ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy nanohub.org/resources/7320 - Web |
| DoITPoMS Teaching and Learning Package - Atomic Fo... DoITPoMS Teaching and Learning Package - Atomic Force Microscopy www.doitpoms.ac.uk/tlplib/afm/index.php - Web |
| SPM gallery: surface scans, collages, artworks, de... SPM gallery: surface scans, collages, artworks, desktop wallpapers www.nanoworld.org/homepages/lapshin/gallery.htm - Web |
Gallery for «Atomic force microscopy»
- AFM noncontactmode.jpg
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| Information about Atomic Force Microscopy (AFM) - ... Information about Atomic Force Microscopy (AFM) - MERI www.shu.ac.uk/research/meri/atomic-force-microscope-afm-0 - Web |
| SPM - Scanning Probe Microscopy Website SPM - Scanning Probe Microscopy Website www.mobot.org/jwcross/spm/ - Web |
| Atomic Force Microscopy resource library Atomic Force Microscopy resource library www.afmuniversity.org - Web |
