Scanning electron microscope

Advanced search

About 7 results found and you can help!

These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs.

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning over it with a high energy focused beam of electrons. The electrons interact with electrons in the sample, producing secondary electrons, back-scattered electrons, and characteristic X-rays that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image.

• See also: Wikipedia, Wikibooks, Commons

• Related: AFM probe, Atomic Force Microscope, Forensic engineering, Forensic science, SEM-EDX

HowStuffWorks - How Scanning Electron Microscopes ... HowStuffWorks - How Scanning Electron Microscopes Work www.howstuffworks.com/scanning-electron-microscope.htm - Web

Notes on the SEM Notes on the SEM www.uga.edu/caur/semindex.htm - Web

Scanning Electron Microscopy basics Scanning Electron Microscopy basics virtual.itg.uiuc.edu/training/EM_tutorial/ - Web

[Add/rearrange links]

Gallery for «Scanning electron microscope»

• 
• 
• 
• 
• 

Average relevance

Preparing a Sample for the SEM Preparing a Sample for the SEM virtual.itg.uiuc.edu/training/esem-prep.mov - Web

Microscopy History links Microscopy History links bama.ua.edu/~hsmithso/class/bsc_656/websites/history.html - Web

Environmental Scanning Electron Microscope (ESEM) ... Environmental Scanning Electron Microscope (ESEM) history www.danilatos.com - Web

Rippel Electron Microscope Facility Rippel Electron Microscope Facility remf.dartmouth.edu/imagesindex.html - Web

[Add/rearrange links]

This results page includes content from Wikipedia which is published under CC BY-SA.