Electromigration
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 SEM image of a failure caused by electromigration in a copper interconnect. The passivation has been removed by RIE and HF |
Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases.
- Related: Integrated circuit, Semiconductor, Electromagnetism, Electrical conduction, Electromigrated Nanogaps, Kirkendall effect
| Semiconductor electromigration in-depth at DWPG.Co... Semiconductor electromigration in-depth at DWPG.Com www.dwpg.com/content.php?contid=2&artid=68 - Web |
| Modeling of electromigration process with void for... Modeling of electromigration process with void formation at UniPro R&D site em.unipro.ru/?q=em/statement - Web |
| DoITPoMS Teaching and Learning Package- "Electromi... DoITPoMS Teaching and Learning Package- "Electromigration" www.doitpoms.ac.uk/tlplib/electromigration/index.php - Web |
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